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J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240052

Technical Papers

J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230603
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230621
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230665
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230559
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230613
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230727
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240073
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240106
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240067
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240044
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20230775
J. Test. Eval.. November 2024, 52(6) doi: https://doi.org/10.1520/JTE20240072
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